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simulation of electron spectra for surface analysis (sessa) version 2.1 user’s guide  (National Institute of Standards and Technology)

 
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    National Institute of Standards and Technology simulation of electron spectra for surface analysis (sessa) version 2.1 user’s guide
    Simulation Of Electron Spectra For Surface Analysis (Sessa) Version 2.1 User’s Guide, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/simulation+of+electron+spectra+for+surface+analysis/simulation+of+electron+spectra+for+surface+analysis++sessa+/10__1002_slash_pssr__202400307-325-7-22
    Average 90 stars, based on 1 article reviews
    simulation of electron spectra for surface analysis (sessa) version 2.1 user’s guide - by Bioz Stars, 2026-09
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    Article Title: Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurements.
    Article Snippet: The National Institute of Standards and Technology (NIST) provides several types of XPS-related data including electron inelastic-mean-free path and effective-attenuation length databases5,58 and a useful program for simulation of XPS spectra (Simulation of Electron Spectra for Surface Analysis).24,25 A variety of other softwares related to XPS peak fitting or analysis is available.5,23,26–28 A great deal of information about XPS can be found online, including webinar-tutorials43,59,60 and other collections of related information.48,61 For those who might like to interact with experienced XPS users directly, various organizations offer short courses on XPS and other surface-analysis methods.62,63 Surface Science Spectra is a peer-reviewed journal/database that contains hundreds of vetted and reviewed spectra.



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